Piezoresponse force microscopy and nanoferroic phenomena

Abstract Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical...

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Autores principales:	Alexei Gruverman, Marin Alexe, Dennis Meier
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2019
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/02c6872dc5104de8b0ed9ee52ea360e2
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spelling	oai:doaj.org-article:02c6872dc5104de8b0ed9ee52ea360e22021-12-02T14:38:43ZPiezoresponse force microscopy and nanoferroic phenomena10.1038/s41467-019-09650-82041-1723https://doaj.org/article/02c6872dc5104de8b0ed9ee52ea360e22019-04-01T00:00:00Zhttps://doi.org/10.1038/s41467-019-09650-8https://doaj.org/toc/2041-1723Abstract Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical role in launching new areas of ferroic research, such as multiferroic devices and domain wall nanoelectronics. The paper reviews the impact of advanced PFM modes concerning the discovery and scientific understanding of novel nanoferroic phenomena and discusses challenges associated with the correct interpretation of PFM data. In conclusion, it offers an outlook for future trends and developments in PFM.Alexei GruvermanMarin AlexeDennis MeierNature PortfolioarticleScienceQENNature Communications, Vol 10, Iss 1, Pp 1-9 (2019)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q Alexei Gruverman Marin Alexe Dennis Meier Piezoresponse force microscopy and nanoferroic phenomena
description	Abstract Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical role in launching new areas of ferroic research, such as multiferroic devices and domain wall nanoelectronics. The paper reviews the impact of advanced PFM modes concerning the discovery and scientific understanding of novel nanoferroic phenomena and discusses challenges associated with the correct interpretation of PFM data. In conclusion, it offers an outlook for future trends and developments in PFM.
format	article
author	Alexei Gruverman Marin Alexe Dennis Meier
author_facet	Alexei Gruverman Marin Alexe Dennis Meier
author_sort	Alexei Gruverman
title	Piezoresponse force microscopy and nanoferroic phenomena
title_short	Piezoresponse force microscopy and nanoferroic phenomena
title_full	Piezoresponse force microscopy and nanoferroic phenomena
title_fullStr	Piezoresponse force microscopy and nanoferroic phenomena
title_full_unstemmed	Piezoresponse force microscopy and nanoferroic phenomena
title_sort	piezoresponse force microscopy and nanoferroic phenomena
publisher	Nature Portfolio
publishDate	2019
url	https://doaj.org/article/02c6872dc5104de8b0ed9ee52ea360e2
work_keys_str_mv	AT alexeigruverman piezoresponseforcemicroscopyandnanoferroicphenomena AT marinalexe piezoresponseforcemicroscopyandnanoferroicphenomena AT dennismeier piezoresponseforcemicroscopyandnanoferroicphenomena
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Piezoresponse force microscopy and nanoferroic phenomena

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