Conformal hexagonal-boron nitride dielectric interface for tungsten diselenide devices with improved mobility and thermal dissipation
Plasma-enhanced chemical vapour deposition (PECVD) is an industrially compatible microelectronics technology. Here, the authors use PECVD to obtain low-temperature, catalyst-free growth of poly-crystalline two-dimensional hexagonal-boron nitride, thus enabling superior thermal dissipation in WSe2 fi...
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Nature Portfolio
2019
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oai:doaj.org-article:03f0bb60becd4df091fcee1d733223252021-12-02T13:23:48ZConformal hexagonal-boron nitride dielectric interface for tungsten diselenide devices with improved mobility and thermal dissipation10.1038/s41467-019-09016-02041-1723https://doaj.org/article/03f0bb60becd4df091fcee1d733223252019-03-01T00:00:00Zhttps://doi.org/10.1038/s41467-019-09016-0https://doaj.org/toc/2041-1723Plasma-enhanced chemical vapour deposition (PECVD) is an industrially compatible microelectronics technology. Here, the authors use PECVD to obtain low-temperature, catalyst-free growth of poly-crystalline two-dimensional hexagonal-boron nitride, thus enabling superior thermal dissipation in WSe2 field-effect transistors with mobility up to 121 cm2 V−1 s−1.Donghua LiuXiaosong ChenYaping YanZhongwei ZhangZhepeng JinKongyang YiCong ZhangYujie ZhengYao WangJun YangXiangfan XuJie ChenYunhao LuDapeng WeiAndrew Thye Shen WeeDacheng WeiNature PortfolioarticleScienceQENNature Communications, Vol 10, Iss 1, Pp 1-11 (2019) |
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Science Q Donghua Liu Xiaosong Chen Yaping Yan Zhongwei Zhang Zhepeng Jin Kongyang Yi Cong Zhang Yujie Zheng Yao Wang Jun Yang Xiangfan Xu Jie Chen Yunhao Lu Dapeng Wei Andrew Thye Shen Wee Dacheng Wei Conformal hexagonal-boron nitride dielectric interface for tungsten diselenide devices with improved mobility and thermal dissipation |
description |
Plasma-enhanced chemical vapour deposition (PECVD) is an industrially compatible microelectronics technology. Here, the authors use PECVD to obtain low-temperature, catalyst-free growth of poly-crystalline two-dimensional hexagonal-boron nitride, thus enabling superior thermal dissipation in WSe2 field-effect transistors with mobility up to 121 cm2 V−1 s−1. |
format |
article |
author |
Donghua Liu Xiaosong Chen Yaping Yan Zhongwei Zhang Zhepeng Jin Kongyang Yi Cong Zhang Yujie Zheng Yao Wang Jun Yang Xiangfan Xu Jie Chen Yunhao Lu Dapeng Wei Andrew Thye Shen Wee Dacheng Wei |
author_facet |
Donghua Liu Xiaosong Chen Yaping Yan Zhongwei Zhang Zhepeng Jin Kongyang Yi Cong Zhang Yujie Zheng Yao Wang Jun Yang Xiangfan Xu Jie Chen Yunhao Lu Dapeng Wei Andrew Thye Shen Wee Dacheng Wei |
author_sort |
Donghua Liu |
title |
Conformal hexagonal-boron nitride dielectric interface for tungsten diselenide devices with improved mobility and thermal dissipation |
title_short |
Conformal hexagonal-boron nitride dielectric interface for tungsten diselenide devices with improved mobility and thermal dissipation |
title_full |
Conformal hexagonal-boron nitride dielectric interface for tungsten diselenide devices with improved mobility and thermal dissipation |
title_fullStr |
Conformal hexagonal-boron nitride dielectric interface for tungsten diselenide devices with improved mobility and thermal dissipation |
title_full_unstemmed |
Conformal hexagonal-boron nitride dielectric interface for tungsten diselenide devices with improved mobility and thermal dissipation |
title_sort |
conformal hexagonal-boron nitride dielectric interface for tungsten diselenide devices with improved mobility and thermal dissipation |
publisher |
Nature Portfolio |
publishDate |
2019 |
url |
https://doaj.org/article/03f0bb60becd4df091fcee1d73322325 |
work_keys_str_mv |
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