Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements
AFM-based nanomechanical measurements are powerful tools for the characterization of polymer composites. However, a flat surface of the samples is usually required, which restricts the wide applications of nanomechanical measurements. In this work, the height-fluctuation induced systematic errors we...
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| Auteurs principaux: | , , , , |
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| Format: | article |
| Langue: | EN |
| Publié: |
Elsevier
2021
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| Sujets: | |
| Accès en ligne: | https://doaj.org/article/04a132e4350d4927a67557aadd11fdcd |
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