Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements

AFM-based nanomechanical measurements are powerful tools for the characterization of polymer composites. However, a flat surface of the samples is usually required, which restricts the wide applications of nanomechanical measurements. In this work, the height-fluctuation induced systematic errors we...

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Autores principales:	Lu Mao, So Fujinami, Wentao Liu, Hao Liu, Ken Nakajima
Formato:	article
Lenguaje:	EN
Publicado:	Elsevier 2021
Materias:	Nanomechanical measurement Height-fluctuation Atomic force microscopy Systematic errors Polymers and polymer manufacture TP1080-1185
Acceso en línea:	https://doaj.org/article/04a132e4350d4927a67557aadd11fdcd
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spelling	oai:doaj.org-article:04a132e4350d4927a67557aadd11fdcd2021-11-24T04:24:19ZCorrection of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements0142-941810.1016/j.polymertesting.2020.106919https://doaj.org/article/04a132e4350d4927a67557aadd11fdcd2021-01-01T00:00:00Zhttp://www.sciencedirect.com/science/article/pii/S0142941820321486https://doaj.org/toc/0142-9418AFM-based nanomechanical measurements are powerful tools for the characterization of polymer composites. However, a flat surface of the samples is usually required, which restricts the wide applications of nanomechanical measurements. In this work, the height-fluctuation induced systematic errors were investigated taking polystyrene beads as the model sample. Corrections were further made based on the assumption that the components of force and deformation parallel to the sample surface can be approximately ignored. Results show the deviations of force and deformation due to height-fluctuations can be well corrected by the proposed method. Moreover, the reliability of the corrected force curves was further verified in the calculation of the mechanical properties. Young's moduli value without height-gradient dependency can be obtained by applying both Johson-Kendall-Roberts (JKR) model and Derjaguin-Muller-Toporov (DMT) model. The correction method proposed in this work can broaden the applications of AFM-based nanomechanical measurements on polymers without strict restrictions on the surface flatness.Lu MaoSo FujinamiWentao LiuHao LiuKen NakajimaElsevierarticleNanomechanical measurementHeight-fluctuationAtomic force microscopySystematic errorsPolymers and polymer manufactureTP1080-1185ENPolymer Testing, Vol 93, Iss , Pp 106919- (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Nanomechanical measurement Height-fluctuation Atomic force microscopy Systematic errors Polymers and polymer manufacture TP1080-1185
spellingShingle	Nanomechanical measurement Height-fluctuation Atomic force microscopy Systematic errors Polymers and polymer manufacture TP1080-1185 Lu Mao So Fujinami Wentao Liu Hao Liu Ken Nakajima Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements
description	AFM-based nanomechanical measurements are powerful tools for the characterization of polymer composites. However, a flat surface of the samples is usually required, which restricts the wide applications of nanomechanical measurements. In this work, the height-fluctuation induced systematic errors were investigated taking polystyrene beads as the model sample. Corrections were further made based on the assumption that the components of force and deformation parallel to the sample surface can be approximately ignored. Results show the deviations of force and deformation due to height-fluctuations can be well corrected by the proposed method. Moreover, the reliability of the corrected force curves was further verified in the calculation of the mechanical properties. Young's moduli value without height-gradient dependency can be obtained by applying both Johson-Kendall-Roberts (JKR) model and Derjaguin-Muller-Toporov (DMT) model. The correction method proposed in this work can broaden the applications of AFM-based nanomechanical measurements on polymers without strict restrictions on the surface flatness.
format	article
author	Lu Mao So Fujinami Wentao Liu Hao Liu Ken Nakajima
author_facet	Lu Mao So Fujinami Wentao Liu Hao Liu Ken Nakajima
author_sort	Lu Mao
title	Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements
title_short	Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements
title_full	Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements
title_fullStr	Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements
title_full_unstemmed	Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements
title_sort	correction of height-fluctuation-induced systematic errors in polymers by afm-based nanomechanical measurements
publisher	Elsevier
publishDate	2021
url	https://doaj.org/article/04a132e4350d4927a67557aadd11fdcd
work_keys_str_mv	AT lumao correctionofheightfluctuationinducedsystematicerrorsinpolymersbyafmbasednanomechanicalmeasurements AT sofujinami correctionofheightfluctuationinducedsystematicerrorsinpolymersbyafmbasednanomechanicalmeasurements AT wentaoliu correctionofheightfluctuationinducedsystematicerrorsinpolymersbyafmbasednanomechanicalmeasurements AT haoliu correctionofheightfluctuationinducedsystematicerrorsinpolymersbyafmbasednanomechanicalmeasurements AT kennakajima correctionofheightfluctuationinducedsystematicerrorsinpolymersbyafmbasednanomechanicalmeasurements
_version_	1718416015372582912

Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements

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