Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements
AFM-based nanomechanical measurements are powerful tools for the characterization of polymer composites. However, a flat surface of the samples is usually required, which restricts the wide applications of nanomechanical measurements. In this work, the height-fluctuation induced systematic errors we...
Saved in:
| Main Authors: | , , , , |
|---|---|
| Format: | article |
| Language: | EN |
| Published: |
Elsevier
2021
|
| Subjects: | |
| Online Access: | https://doaj.org/article/04a132e4350d4927a67557aadd11fdcd |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|