Ultrafast current imaging by Bayesian inversion

Scanning probe microscopy is widely used to characterize material properties with atomic resolution, yet electronic property mapping is normally constrained by slow data acquisition. Somnath et al. show a current–voltage method, which enables fast electronic spectroscopy mapping over micrometer-size...

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Autores principales:	S. Somnath, K. J. H. Law, A. N. Morozovska, P. Maksymovych, Y. Kim, X. Lu, M. Alexe, R. Archibald, S. V. Kalinin, S. Jesse, R. K. Vasudevan
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2018
Materias:	Science Q
Acceso en línea:	https://doaj.org/article/0560a29d3d0542a29e7e7ef7cbf10762
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spelling	oai:doaj.org-article:0560a29d3d0542a29e7e7ef7cbf107622021-12-02T17:33:02ZUltrafast current imaging by Bayesian inversion10.1038/s41467-017-02455-72041-1723https://doaj.org/article/0560a29d3d0542a29e7e7ef7cbf107622018-02-01T00:00:00Zhttps://doi.org/10.1038/s41467-017-02455-7https://doaj.org/toc/2041-1723Scanning probe microscopy is widely used to characterize material properties with atomic resolution, yet electronic property mapping is normally constrained by slow data acquisition. Somnath et al. show a current–voltage method, which enables fast electronic spectroscopy mapping over micrometer-sized areas.S. SomnathK. J. H. LawA. N. MorozovskaP. MaksymovychY. KimX. LuM. AlexeR. ArchibaldS. V. KalininS. JesseR. K. VasudevanNature PortfolioarticleScienceQENNature Communications, Vol 9, Iss 1, Pp 1-11 (2018)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q
spellingShingle	Science Q S. Somnath K. J. H. Law A. N. Morozovska P. Maksymovych Y. Kim X. Lu M. Alexe R. Archibald S. V. Kalinin S. Jesse R. K. Vasudevan Ultrafast current imaging by Bayesian inversion
description	Scanning probe microscopy is widely used to characterize material properties with atomic resolution, yet electronic property mapping is normally constrained by slow data acquisition. Somnath et al. show a current–voltage method, which enables fast electronic spectroscopy mapping over micrometer-sized areas.
format	article
author	S. Somnath K. J. H. Law A. N. Morozovska P. Maksymovych Y. Kim X. Lu M. Alexe R. Archibald S. V. Kalinin S. Jesse R. K. Vasudevan
author_facet	S. Somnath K. J. H. Law A. N. Morozovska P. Maksymovych Y. Kim X. Lu M. Alexe R. Archibald S. V. Kalinin S. Jesse R. K. Vasudevan
author_sort	S. Somnath
title	Ultrafast current imaging by Bayesian inversion
title_short	Ultrafast current imaging by Bayesian inversion
title_full	Ultrafast current imaging by Bayesian inversion
title_fullStr	Ultrafast current imaging by Bayesian inversion
title_full_unstemmed	Ultrafast current imaging by Bayesian inversion
title_sort	ultrafast current imaging by bayesian inversion
publisher	Nature Portfolio
publishDate	2018
url	https://doaj.org/article/0560a29d3d0542a29e7e7ef7cbf10762
work_keys_str_mv	AT ssomnath ultrafastcurrentimagingbybayesianinversion AT kjhlaw ultrafastcurrentimagingbybayesianinversion AT anmorozovska ultrafastcurrentimagingbybayesianinversion AT pmaksymovych ultrafastcurrentimagingbybayesianinversion AT ykim ultrafastcurrentimagingbybayesianinversion AT xlu ultrafastcurrentimagingbybayesianinversion AT malexe ultrafastcurrentimagingbybayesianinversion AT rarchibald ultrafastcurrentimagingbybayesianinversion AT svkalinin ultrafastcurrentimagingbybayesianinversion AT sjesse ultrafastcurrentimagingbybayesianinversion AT rkvasudevan ultrafastcurrentimagingbybayesianinversion
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Ultrafast current imaging by Bayesian inversion

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