Simulating 50 keV X-ray Photon Detection in Silicon with a Down-Conversion Layer
Simulation results are presented that explore an innovative, new design for X-ray detection in the 20–50 keV range that is an alternative to traditional direct and indirect detection methods. Typical indirect detection using a scintillator must trade-off between absorption efficiency and spatial res...
Enregistré dans:
| Auteurs principaux: | , , , , |
|---|---|
| Format: | article |
| Langue: | EN |
| Publié: |
MDPI AG
2021
|
| Sujets: | |
| Accès en ligne: | https://doaj.org/article/06ea42cec4f443198a2e42637f2dfa43 |
| Tags: |
Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
|