Robust edge photocurrent response on layered type II Weyl semimetal WTe2

Robust edge photocurrent response on layered type II Weyl semimetal WTe2

Novel optoelectronic properties have recently been observed in topological semimetals. Here, Wang et al. report a robust photocurrent generated from charge separation of photoexcited electron-hole pairs at the edge of a type-II Weyl semimetal, T d-WTe2.

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Detalles Bibliográficos
Autores principales: Qinsheng Wang, Jingchuan Zheng, Yuan He, Jin Cao, Xin Liu, Maoyuan Wang, Junchao Ma, Jiawei Lai, Hong Lu, Shuang Jia, Dayu Yan, Youguo Shi, Junxi Duan, Junfeng Han, Wende Xiao, Jian-Hao Chen, Kai Sun, Yugui Yao, Dong Sun
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2019
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Science
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Acceso en línea:https://doaj.org/article/0df81aafe77a4d5e987ec96238848a80
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https://doaj.org/article/0df81aafe77a4d5e987ec96238848a80

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