Optical Characterization of H-Free <i>a</i>-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization

Optical Characterization of H-Free <i>a</i>-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization

Several, nearly-1-µ<inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mi mathvariant="normal">m</mi></semantics></math></inline-formula>-thick, pure, unhydrogenated amorphous-sili...

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Autores principales: Emilio Márquez, Juan J. Ruíz-Pérez, Manuel Ballester, Almudena P. Márquez, Eduardo Blanco, Dorian Minkov, Susana M. Fernández Ruano, Elias Saugar
Formato: article
Lenguaje:EN
Publicado: MDPI AG 2021
Materias:
amorphous semiconductors
optical properties
dielectric function
thin-film characterization
Tauc–Lorentz model
Tauc–Lorentz–Urbach model
Engineering (General). Civil engineering (General)
TA1-2040
Acceso en línea:https://doaj.org/article/0ebc5b8c66e84f9288485abf11e804db
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