Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation

A thin film of CuInxGa(1-x)Se2 obtained by physical vapor deposition on a glass substrate covered by a Mo-film has been tested by the second harmonic generation (SHG) technique. The intensity of reflected SHG has been measured as a function of rotation angle around normal to the sample...

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Autores principales: Buiniţkaia, Gohvar, Culiuc, Leonid, Miroviţkii, Vadim, Mishina, E., Şerstiuc, N., Ramanathan, K.
Formato: article
Lenguaje:EN
Publicado: D.Ghitu Institute of Electronic Engineering and Nanotechnologies 2011
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Acceso en línea:https://doaj.org/article/12d527ce0784446e9153cab1d5169394
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