Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation

A thin film of CuInxGa(1-x)Se2 obtained by physical vapor deposition on a glass substrate covered by a Mo-film has been tested by the second harmonic generation (SHG) technique. The intensity of reflected SHG has been measured as a function of rotation angle around normal to the sample...

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Autores principales:	Buiniţkaia, Gohvar, Culiuc, Leonid, Miroviţkii, Vadim, Mishina, E., Şerstiuc, N., Ramanathan, K.
Formato:	article
Lenguaje:	EN
Publicado:	D.Ghitu Institute of Electronic Engineering and Nanotechnologies 2011
Materias:	Physics QC1-999 Electronics TK7800-8360
Acceso en línea:	https://doaj.org/article/12d527ce0784446e9153cab1d5169394
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spelling	oai:doaj.org-article:12d527ce0784446e9153cab1d51693942021-11-21T12:03:02ZCharacterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation2537-63651810-648Xhttps://doaj.org/article/12d527ce0784446e9153cab1d51693942011-02-01T00:00:00Zhttps://mjps.nanotech.md/archive/2011/article/4314https://doaj.org/toc/1810-648Xhttps://doaj.org/toc/2537-6365A thin film of CuInxGa(1-x)Se2 obtained by physical vapor deposition on a glass substrate covered by a Mo-film has been tested by the second harmonic generation (SHG) technique. The intensity of reflected SHG has been measured as a function of rotation angle around normal to the sample surface. To reveal the preferential orientation of micro-crystals in the film, using these data, the theoretical model of SHG in a multilayered structure has been developed. In the frame of the proposed model, the Euler angles defining the orientation of optical axis of the film texture, the ratio of two constants of nonlinear susceptibility, and the effective thickness of the film were numerically calculated. Buiniţkaia, GohvarCuliuc, LeonidMiroviţkii, VadimMishina, E.Şerstiuc, N.Ramanathan, K.D.Ghitu Institute of Electronic Engineering and NanotechnologiesarticlePhysicsQC1-999ElectronicsTK7800-8360ENMoldavian Journal of the Physical Sciences, Vol 10, Iss 1, Pp 96-102 (2011)
institution	DOAJ
collection	DOAJ
language	EN
topic	Physics QC1-999 Electronics TK7800-8360
spellingShingle	Physics QC1-999 Electronics TK7800-8360 Buiniţkaia, Gohvar Culiuc, Leonid Miroviţkii, Vadim Mishina, E. Şerstiuc, N. Ramanathan, K. Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation
description	A thin film of CuInxGa(1-x)Se2 obtained by physical vapor deposition on a glass substrate covered by a Mo-film has been tested by the second harmonic generation (SHG) technique. The intensity of reflected SHG has been measured as a function of rotation angle around normal to the sample surface. To reveal the preferential orientation of micro-crystals in the film, using these data, the theoretical model of SHG in a multilayered structure has been developed. In the frame of the proposed model, the Euler angles defining the orientation of optical axis of the film texture, the ratio of two constants of nonlinear susceptibility, and the effective thickness of the film were numerically calculated.
format	article
author	Buiniţkaia, Gohvar Culiuc, Leonid Miroviţkii, Vadim Mishina, E. Şerstiuc, N. Ramanathan, K.
author_facet	Buiniţkaia, Gohvar Culiuc, Leonid Miroviţkii, Vadim Mishina, E. Şerstiuc, N. Ramanathan, K.
author_sort	Buiniţkaia, Gohvar
title	Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation
title_short	Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation
title_full	Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation
title_fullStr	Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation
title_full_unstemmed	Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation
title_sort	characterization of cu(in,ga)se2 thin films using reflected second harmonic generation
publisher	D.Ghitu Institute of Electronic Engineering and Nanotechnologies
publishDate	2011
url	https://doaj.org/article/12d527ce0784446e9153cab1d5169394
work_keys_str_mv	AT buinitkaiagohvar characterizationofcuingase2thinfilmsusingreflectedsecondharmonicgeneration AT culiucleonid characterizationofcuingase2thinfilmsusingreflectedsecondharmonicgeneration AT mirovitkiivadim characterizationofcuingase2thinfilmsusingreflectedsecondharmonicgeneration AT mishinae characterizationofcuingase2thinfilmsusingreflectedsecondharmonicgeneration AT serstiucn characterizationofcuingase2thinfilmsusingreflectedsecondharmonicgeneration AT ramanathank characterizationofcuingase2thinfilmsusingreflectedsecondharmonicgeneration
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Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation

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