Characterization of Cu(In,Ga)Se2 thin films using reflected second harmonic generation
A thin film of CuInxGa(1-x)Se2 obtained by physical vapor deposition on a glass substrate covered by a Mo-film has been tested by the second harmonic generation (SHG) technique. The intensity of reflected SHG has been measured as a function of rotation angle around normal to the sample...
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Auteurs principaux: | Buiniţkaia, Gohvar, Culiuc, Leonid, Miroviţkii, Vadim, Mishina, E., Şerstiuc, N., Ramanathan, K. |
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Format: | article |
Langue: | EN |
Publié: |
D.Ghitu Institute of Electronic Engineering and Nanotechnologies
2011
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Sujets: | |
Accès en ligne: | https://doaj.org/article/12d527ce0784446e9153cab1d5169394 |
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