Deep gallium-induced defect states in Pb1-xSnxTe

The galvanomagnetic effects in Pb1-xSnxTe: Ga under variation of alloy composition were investigated. It was found for samples with tin content x≤0.06 the temperature dependences of resistivity and the Hall coefficient have a low temperature activation range of impurity ionization, while for samp...

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Bibliographic Details
Main Authors: Skipetrov, E., Zvereva, E., Dmitriev, N., Golubev, A., Sliniko, V.
Format: article
Language:EN
Published: D.Ghitu Institute of Electronic Engineering and Nanotechnologies 2006
Subjects:
Online Access:https://doaj.org/article/139461ae82f24184b605a20081e733db
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