Cita APA (7a ed.)

Xu, X. B., Li, B., Chen, Y. Q., Wu, Z. H., He, Z. Y., Liu, L., . . . Huang, Y. (2021). Analysis of Trap and Recovery Characteristics Based on Low-Frequency Noise for E-Mode GaN HEMTs Under Electrostatic Discharge Stress. IEEE.

Cita Chicago Style (17a ed.)

Xu, X. B., B. Li, Y. Q. Chen, Z. H. Wu, Z. Y. He, L. Liu, S. Z. He, Y. F. En, y Y. Huang. Analysis of Trap and Recovery Characteristics Based on Low-Frequency Noise for E-Mode GaN HEMTs Under Electrostatic Discharge Stress. IEEE, 2021.

Cita MLA (8a ed.)

Xu, X. B., et al. Analysis of Trap and Recovery Characteristics Based on Low-Frequency Noise for E-Mode GaN HEMTs Under Electrostatic Discharge Stress. IEEE, 2021.