Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices

Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices

In this paper, a novel fabrication technology of atomic force microscopy (AFM) probes integrating cantilever tips with an NV-rich diamond particle is presented. Nanomanipulation techniques combined with the focused electron beam-induced deposition (FEBID) procedure were applied to position the NV-ri...

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Autores principales: Mateusz Ficek, Maciej J. Głowacki, Krzysztof Gajewski, Piotr Kunicki, Ewelina Gacka, Krystian Sycz, Mariusz Mrózek, Adam M. Wojciechowski, Teodor P. Gotszalk, Wojciech Gawlik, Robert Bogdanowicz
Formato: article
Lenguaje:EN
Publicado: MDPI AG 2021
Materias:
fluorescent nanodiamond
AFM
ODMR
Engineering (General). Civil engineering (General)
TA1-2040
Acceso en línea:https://doaj.org/article/22e68bec95a54344b5247e14bf705bee
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https://doaj.org/article/22e68bec95a54344b5247e14bf705bee

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