Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices

In this paper, a novel fabrication technology of atomic force microscopy (AFM) probes integrating cantilever tips with an NV-rich diamond particle is presented. Nanomanipulation techniques combined with the focused electron beam-induced deposition (FEBID) procedure were applied to position the NV-ri...

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Autores principales:	Mateusz Ficek, Maciej J. Głowacki, Krzysztof Gajewski, Piotr Kunicki, Ewelina Gacka, Krystian Sycz, Mariusz Mrózek, Adam M. Wojciechowski, Teodor P. Gotszalk, Wojciech Gawlik, Robert Bogdanowicz
Formato:	article
Lenguaje:	EN
Publicado:	MDPI AG 2021
Materias:	fluorescent nanodiamond AFM ODMR Engineering (General). Civil engineering (General) TA1-2040
Acceso en línea:	https://doaj.org/article/22e68bec95a54344b5247e14bf705bee
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spelling	oai:doaj.org-article:22e68bec95a54344b5247e14bf705bee2021-11-25T17:16:07ZIntegration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices10.3390/coatings111113322079-6412https://doaj.org/article/22e68bec95a54344b5247e14bf705bee2021-10-01T00:00:00Zhttps://www.mdpi.com/2079-6412/11/11/1332https://doaj.org/toc/2079-6412In this paper, a novel fabrication technology of atomic force microscopy (AFM) probes integrating cantilever tips with an NV-rich diamond particle is presented. Nanomanipulation techniques combined with the focused electron beam-induced deposition (FEBID) procedure were applied to position the NV-rich diamond particle on an AFM cantilever tip. Ultrasonic treatment of nanodiamond suspension was applied to reduce the size of diamond particles for proper geometry and symmetry. The fabricated AFM probes were tested utilizing measurements of the electrical resistance at highly oriented pyrolytic graphite (HOPG) and compared with a standard AFM cantilever performance. The results showed novel perspectives arising from combining the functionalities of a scanning AFM with optically detected magnetic resonance (ODMR). In particular, it offers enhanced magnetometric sensitivity and the nanometric resolution.Mateusz FicekMaciej J. GłowackiKrzysztof GajewskiPiotr KunickiEwelina GackaKrystian SyczMariusz MrózekAdam M. WojciechowskiTeodor P. GotszalkWojciech GawlikRobert BogdanowiczMDPI AGarticlefluorescent nanodiamondAFMODMREngineering (General). Civil engineering (General)TA1-2040ENCoatings, Vol 11, Iss 1332, p 1332 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	fluorescent nanodiamond AFM ODMR Engineering (General). Civil engineering (General) TA1-2040
spellingShingle	fluorescent nanodiamond AFM ODMR Engineering (General). Civil engineering (General) TA1-2040 Mateusz Ficek Maciej J. Głowacki Krzysztof Gajewski Piotr Kunicki Ewelina Gacka Krystian Sycz Mariusz Mrózek Adam M. Wojciechowski Teodor P. Gotszalk Wojciech Gawlik Robert Bogdanowicz Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices
description	In this paper, a novel fabrication technology of atomic force microscopy (AFM) probes integrating cantilever tips with an NV-rich diamond particle is presented. Nanomanipulation techniques combined with the focused electron beam-induced deposition (FEBID) procedure were applied to position the NV-rich diamond particle on an AFM cantilever tip. Ultrasonic treatment of nanodiamond suspension was applied to reduce the size of diamond particles for proper geometry and symmetry. The fabricated AFM probes were tested utilizing measurements of the electrical resistance at highly oriented pyrolytic graphite (HOPG) and compared with a standard AFM cantilever performance. The results showed novel perspectives arising from combining the functionalities of a scanning AFM with optically detected magnetic resonance (ODMR). In particular, it offers enhanced magnetometric sensitivity and the nanometric resolution.
format	article
author	Mateusz Ficek Maciej J. Głowacki Krzysztof Gajewski Piotr Kunicki Ewelina Gacka Krystian Sycz Mariusz Mrózek Adam M. Wojciechowski Teodor P. Gotszalk Wojciech Gawlik Robert Bogdanowicz
author_facet	Mateusz Ficek Maciej J. Głowacki Krzysztof Gajewski Piotr Kunicki Ewelina Gacka Krystian Sycz Mariusz Mrózek Adam M. Wojciechowski Teodor P. Gotszalk Wojciech Gawlik Robert Bogdanowicz
author_sort	Mateusz Ficek
title	Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices
title_short	Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices
title_full	Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices
title_fullStr	Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices
title_full_unstemmed	Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices
title_sort	integration of fluorescent, nv-rich nanodiamond particles with afm cantilevers by focused ion beam for hybrid optical and micromechanical devices
publisher	MDPI AG
publishDate	2021
url	https://doaj.org/article/22e68bec95a54344b5247e14bf705bee
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Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices

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