Fast acquisition protocol for X-ray scattering tensor tomography

Abstract Microstructural information over an entire sample is important to understand the macroscopic behaviour of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition p...

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Autores principales: Jisoo Kim, Matias Kagias, Federica Marone, Zhitian Shi, Marco Stampanoni
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
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Acceso en línea:https://doaj.org/article/23333b358fdc4fc99f3cad65be300fa2
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