Fast acquisition protocol for X-ray scattering tensor tomography

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Fast acquisition protocol for X-ray scattering tensor tomography

Abstract Microstructural information over an entire sample is important to understand the macroscopic behaviour of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition p...

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Detalles Bibliográficos
Autores principales:	Jisoo Kim, Matias Kagias, Federica Marone, Zhitian Shi, Marco Stampanoni
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2021
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/23333b358fdc4fc99f3cad65be300fa2
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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