Bonding of a Carbon Nanotube Film to a Au Film at Low Temperature and Contact Resistance of the Film under Micronewton Loads

A process for bonding a carbon nanotube (CNT) film to a Au film at low temperature was developed with a view to using the CNT films as electrical contact materials in radio-frequency microelectromechanical systems (RF MEMS) switches. First, a CNT film was synthesized on a silicon substrate at 750 &a...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Hiroshi Kinoshita, Yoshitada Isono, Nobuo Ohmae
Formato: article
Lenguaje:EN
Publicado: Japanese Society of Tribologists 2011
Materias:
Acceso en línea:https://doaj.org/article/249d89cd2f984ddba2c897317d5c37cc
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
id oai:doaj.org-article:249d89cd2f984ddba2c897317d5c37cc
record_format dspace
spelling oai:doaj.org-article:249d89cd2f984ddba2c897317d5c37cc2021-11-05T09:25:54ZBonding of a Carbon Nanotube Film to a Au Film at Low Temperature and Contact Resistance of the Film under Micronewton Loads1881-219810.2474/trol.6.189https://doaj.org/article/249d89cd2f984ddba2c897317d5c37cc2011-02-01T00:00:00Zhttps://www.jstage.jst.go.jp/article/trol/6/4/6_4_189/_pdf/-char/enhttps://doaj.org/toc/1881-2198A process for bonding a carbon nanotube (CNT) film to a Au film at low temperature was developed with a view to using the CNT films as electrical contact materials in radio-frequency microelectromechanical systems (RF MEMS) switches. First, a CNT film was synthesized on a silicon substrate at 750 °C and subsequently coated with Au at room temperature. Finally, the Au-coated CNT film was bonded at 100 °C to a Au film, which was then deposited on a silicon substrate to act as a transmission line. An apparatus was developed to measure contact resistances and forces under contact conditions mimicking those that will be encountered in actual RF MEMS switches, such as micronewton loads and square-micrometer contact areas. Contact resistance and force of the bonded CNT film sample were simultaneously measured as a function of displacement between the sample and an electrode Au tip and compared with those for a Au film and Au-coated CNT film. The bonded CNT film sample had no adhesion force, but higher contact resistance than the other samples.Hiroshi KinoshitaYoshitada IsonoNobuo OhmaeJapanese Society of Tribologistsarticlerf memscarbon nanotubecontact resistancecontact loadPhysicsQC1-999Engineering (General). Civil engineering (General)TA1-2040Mechanical engineering and machineryTJ1-1570ChemistryQD1-999ENTribology Online, Vol 6, Iss 4, Pp 189-192 (2011)
institution DOAJ
collection DOAJ
language EN
topic rf mems
carbon nanotube
contact resistance
contact load
Physics
QC1-999
Engineering (General). Civil engineering (General)
TA1-2040
Mechanical engineering and machinery
TJ1-1570
Chemistry
QD1-999
spellingShingle rf mems
carbon nanotube
contact resistance
contact load
Physics
QC1-999
Engineering (General). Civil engineering (General)
TA1-2040
Mechanical engineering and machinery
TJ1-1570
Chemistry
QD1-999
Hiroshi Kinoshita
Yoshitada Isono
Nobuo Ohmae
Bonding of a Carbon Nanotube Film to a Au Film at Low Temperature and Contact Resistance of the Film under Micronewton Loads
description A process for bonding a carbon nanotube (CNT) film to a Au film at low temperature was developed with a view to using the CNT films as electrical contact materials in radio-frequency microelectromechanical systems (RF MEMS) switches. First, a CNT film was synthesized on a silicon substrate at 750 °C and subsequently coated with Au at room temperature. Finally, the Au-coated CNT film was bonded at 100 °C to a Au film, which was then deposited on a silicon substrate to act as a transmission line. An apparatus was developed to measure contact resistances and forces under contact conditions mimicking those that will be encountered in actual RF MEMS switches, such as micronewton loads and square-micrometer contact areas. Contact resistance and force of the bonded CNT film sample were simultaneously measured as a function of displacement between the sample and an electrode Au tip and compared with those for a Au film and Au-coated CNT film. The bonded CNT film sample had no adhesion force, but higher contact resistance than the other samples.
format article
author Hiroshi Kinoshita
Yoshitada Isono
Nobuo Ohmae
author_facet Hiroshi Kinoshita
Yoshitada Isono
Nobuo Ohmae
author_sort Hiroshi Kinoshita
title Bonding of a Carbon Nanotube Film to a Au Film at Low Temperature and Contact Resistance of the Film under Micronewton Loads
title_short Bonding of a Carbon Nanotube Film to a Au Film at Low Temperature and Contact Resistance of the Film under Micronewton Loads
title_full Bonding of a Carbon Nanotube Film to a Au Film at Low Temperature and Contact Resistance of the Film under Micronewton Loads
title_fullStr Bonding of a Carbon Nanotube Film to a Au Film at Low Temperature and Contact Resistance of the Film under Micronewton Loads
title_full_unstemmed Bonding of a Carbon Nanotube Film to a Au Film at Low Temperature and Contact Resistance of the Film under Micronewton Loads
title_sort bonding of a carbon nanotube film to a au film at low temperature and contact resistance of the film under micronewton loads
publisher Japanese Society of Tribologists
publishDate 2011
url https://doaj.org/article/249d89cd2f984ddba2c897317d5c37cc
work_keys_str_mv AT hiroshikinoshita bondingofacarbonnanotubefilmtoaaufilmatlowtemperatureandcontactresistanceofthefilmundermicronewtonloads
AT yoshitadaisono bondingofacarbonnanotubefilmtoaaufilmatlowtemperatureandcontactresistanceofthefilmundermicronewtonloads
AT nobuoohmae bondingofacarbonnanotubefilmtoaaufilmatlowtemperatureandcontactresistanceofthefilmundermicronewtonloads
_version_ 1718444337146101760