Kwon, S., Kwon, H., Han, I., Jang, J., Oh, S., Song, H., . . . Lee, H. (2018). Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of p-MOSFETs. IEEE.
Style de citation Chicago (17e éd.)Kwon, Sung-Kyu, et al. Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of P-MOSFETs. IEEE, 2018.
Style de citation MLA (8e éd.)Kwon, Sung-Kyu, et al. Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of P-MOSFETs. IEEE, 2018.
Attention : ces citations peuvent ne pas être correctes à 100%.