Fullerene-Containing Electrically Conducting Electron Beam Resist for Ultrahigh Integration of Nanometer Lateral-Scale Organic Electronic Devices
Abstract An outstanding issue with organic devices is the difficulty of simultaneously controlling the lateral size and position of structures at submicron or nanometer scales. In this study, nanocomposite electron beam (EB) organic resists are proved to be excellent candidates for electrically cond...
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Formato: | article |
Lenguaje: | EN |
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Nature Portfolio
2017
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Acceso en línea: | https://doaj.org/article/2abc5f484dc343d0974596c070f4f7f9 |
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