Probing the edge-related properties of atomically thin MoS2 at nanoscale
Probing inevitable defects in two- dimensional materials is challenging. Here, the authors tackle this issue by using tip-enhanced Raman spectroscopy (TERS) to obtain distinctly different Raman features of edge defects in atomically thin MoS2, and further probe their unique electronic properties as...
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Nature Portfolio
2019
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oai:doaj.org-article:2fc60b96a294417784abd88f50fef9392021-12-02T14:40:17ZProbing the edge-related properties of atomically thin MoS2 at nanoscale10.1038/s41467-019-13486-72041-1723https://doaj.org/article/2fc60b96a294417784abd88f50fef9392019-12-01T00:00:00Zhttps://doi.org/10.1038/s41467-019-13486-7https://doaj.org/toc/2041-1723Probing inevitable defects in two- dimensional materials is challenging. Here, the authors tackle this issue by using tip-enhanced Raman spectroscopy (TERS) to obtain distinctly different Raman features of edge defects in atomically thin MoS2, and further probe their unique electronic properties as well as identify the armchair and zigzag edges.Teng-Xiang HuangXin CongSi-Si WuKai-Qiang LinXu YaoYu-Han HeJiang-Bin WuYi-Fan BaoSheng-Chao HuangXiang WangPing-Heng TanBin RenNature PortfolioarticleScienceQENNature Communications, Vol 10, Iss 1, Pp 1-8 (2019) |
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Science Q Teng-Xiang Huang Xin Cong Si-Si Wu Kai-Qiang Lin Xu Yao Yu-Han He Jiang-Bin Wu Yi-Fan Bao Sheng-Chao Huang Xiang Wang Ping-Heng Tan Bin Ren Probing the edge-related properties of atomically thin MoS2 at nanoscale |
description |
Probing inevitable defects in two- dimensional materials is challenging. Here, the authors tackle this issue by using tip-enhanced Raman spectroscopy (TERS) to obtain distinctly different Raman features of edge defects in atomically thin MoS2, and further probe their unique electronic properties as well as identify the armchair and zigzag edges. |
format |
article |
author |
Teng-Xiang Huang Xin Cong Si-Si Wu Kai-Qiang Lin Xu Yao Yu-Han He Jiang-Bin Wu Yi-Fan Bao Sheng-Chao Huang Xiang Wang Ping-Heng Tan Bin Ren |
author_facet |
Teng-Xiang Huang Xin Cong Si-Si Wu Kai-Qiang Lin Xu Yao Yu-Han He Jiang-Bin Wu Yi-Fan Bao Sheng-Chao Huang Xiang Wang Ping-Heng Tan Bin Ren |
author_sort |
Teng-Xiang Huang |
title |
Probing the edge-related properties of atomically thin MoS2 at nanoscale |
title_short |
Probing the edge-related properties of atomically thin MoS2 at nanoscale |
title_full |
Probing the edge-related properties of atomically thin MoS2 at nanoscale |
title_fullStr |
Probing the edge-related properties of atomically thin MoS2 at nanoscale |
title_full_unstemmed |
Probing the edge-related properties of atomically thin MoS2 at nanoscale |
title_sort |
probing the edge-related properties of atomically thin mos2 at nanoscale |
publisher |
Nature Portfolio |
publishDate |
2019 |
url |
https://doaj.org/article/2fc60b96a294417784abd88f50fef939 |
work_keys_str_mv |
AT tengxianghuang probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale AT xincong probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale AT sisiwu probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale AT kaiqianglin probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale AT xuyao probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale AT yuhanhe probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale AT jiangbinwu probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale AT yifanbao probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale AT shengchaohuang probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale AT xiangwang probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale AT pinghengtan probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale AT binren probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale |
_version_ |
1718390348522192896 |