Probing the edge-related properties of atomically thin MoS2 at nanoscale

Probing inevitable defects in two- dimensional materials is challenging. Here, the authors tackle this issue by using tip-enhanced Raman spectroscopy (TERS) to obtain distinctly different Raman features of edge defects in atomically thin MoS2, and further probe their unique electronic properties as...

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Autores principales: Teng-Xiang Huang, Xin Cong, Si-Si Wu, Kai-Qiang Lin, Xu Yao, Yu-Han He, Jiang-Bin Wu, Yi-Fan Bao, Sheng-Chao Huang, Xiang Wang, Ping-Heng Tan, Bin Ren
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Lenguaje:EN
Publicado: Nature Portfolio 2019
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Acceso en línea:https://doaj.org/article/2fc60b96a294417784abd88f50fef939
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spelling oai:doaj.org-article:2fc60b96a294417784abd88f50fef9392021-12-02T14:40:17ZProbing the edge-related properties of atomically thin MoS2 at nanoscale10.1038/s41467-019-13486-72041-1723https://doaj.org/article/2fc60b96a294417784abd88f50fef9392019-12-01T00:00:00Zhttps://doi.org/10.1038/s41467-019-13486-7https://doaj.org/toc/2041-1723Probing inevitable defects in two- dimensional materials is challenging. Here, the authors tackle this issue by using tip-enhanced Raman spectroscopy (TERS) to obtain distinctly different Raman features of edge defects in atomically thin MoS2, and further probe their unique electronic properties as well as identify the armchair and zigzag edges.Teng-Xiang HuangXin CongSi-Si WuKai-Qiang LinXu YaoYu-Han HeJiang-Bin WuYi-Fan BaoSheng-Chao HuangXiang WangPing-Heng TanBin RenNature PortfolioarticleScienceQENNature Communications, Vol 10, Iss 1, Pp 1-8 (2019)
institution DOAJ
collection DOAJ
language EN
topic Science
Q
spellingShingle Science
Q
Teng-Xiang Huang
Xin Cong
Si-Si Wu
Kai-Qiang Lin
Xu Yao
Yu-Han He
Jiang-Bin Wu
Yi-Fan Bao
Sheng-Chao Huang
Xiang Wang
Ping-Heng Tan
Bin Ren
Probing the edge-related properties of atomically thin MoS2 at nanoscale
description Probing inevitable defects in two- dimensional materials is challenging. Here, the authors tackle this issue by using tip-enhanced Raman spectroscopy (TERS) to obtain distinctly different Raman features of edge defects in atomically thin MoS2, and further probe their unique electronic properties as well as identify the armchair and zigzag edges.
format article
author Teng-Xiang Huang
Xin Cong
Si-Si Wu
Kai-Qiang Lin
Xu Yao
Yu-Han He
Jiang-Bin Wu
Yi-Fan Bao
Sheng-Chao Huang
Xiang Wang
Ping-Heng Tan
Bin Ren
author_facet Teng-Xiang Huang
Xin Cong
Si-Si Wu
Kai-Qiang Lin
Xu Yao
Yu-Han He
Jiang-Bin Wu
Yi-Fan Bao
Sheng-Chao Huang
Xiang Wang
Ping-Heng Tan
Bin Ren
author_sort Teng-Xiang Huang
title Probing the edge-related properties of atomically thin MoS2 at nanoscale
title_short Probing the edge-related properties of atomically thin MoS2 at nanoscale
title_full Probing the edge-related properties of atomically thin MoS2 at nanoscale
title_fullStr Probing the edge-related properties of atomically thin MoS2 at nanoscale
title_full_unstemmed Probing the edge-related properties of atomically thin MoS2 at nanoscale
title_sort probing the edge-related properties of atomically thin mos2 at nanoscale
publisher Nature Portfolio
publishDate 2019
url https://doaj.org/article/2fc60b96a294417784abd88f50fef939
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AT xincong probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale
AT sisiwu probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale
AT kaiqianglin probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale
AT xuyao probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale
AT yuhanhe probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale
AT jiangbinwu probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale
AT yifanbao probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale
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AT xiangwang probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale
AT pinghengtan probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale
AT binren probingtheedgerelatedpropertiesofatomicallythinmos2atnanoscale
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