Probing the edge-related properties of atomically thin MoS2 at nanoscale

Probing the edge-related properties of atomically thin MoS2 at nanoscale

Probing inevitable defects in two- dimensional materials is challenging. Here, the authors tackle this issue by using tip-enhanced Raman spectroscopy (TERS) to obtain distinctly different Raman features of edge defects in atomically thin MoS2, and further probe their unique electronic properties as...

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Autores principales: Teng-Xiang Huang, Xin Cong, Si-Si Wu, Kai-Qiang Lin, Xu Yao, Yu-Han He, Jiang-Bin Wu, Yi-Fan Bao, Sheng-Chao Huang, Xiang Wang, Ping-Heng Tan, Bin Ren
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2019
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Science
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Acceso en línea:https://doaj.org/article/2fc60b96a294417784abd88f50fef939
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