Data Augmentation of Backscatter X-ray Images for Deep Learning-Based Automatic Cargo Inspection
Custom inspection using X-ray imaging is a very promising application of modern pattern recognition technology. However, the lack of data or renewal of tariff items makes the application of such technology difficult. In this paper, we present a data augmentation technique based on a new image-to-ima...
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| Autores principales: | , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
MDPI AG
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/35adbe6a39f94563a90fff1916f4e633 |
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