Data Augmentation of Backscatter X-ray Images for Deep Learning-Based Automatic Cargo Inspection

Custom inspection using X-ray imaging is a very promising application of modern pattern recognition technology. However, the lack of data or renewal of tariff items makes the application of such technology difficult. In this paper, we present a data augmentation technique based on a new image-to-ima...

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Auteurs principaux: Hyunwoo Cho, Haesol Park, Ig-Jae Kim, Junghyun Cho
Format: article
Langue:EN
Publié: MDPI AG 2021
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Accès en ligne:https://doaj.org/article/35adbe6a39f94563a90fff1916f4e633
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