Super-regular femtosecond laser nanolithography based on dual-interface plasmons coupling

Advances in femtosecond laser-material interaction facilitate the extension of maskless optical processing to the high efficiency and deep-subwavelength scale. Here, a hybrid plasmon lithography technique has been demonstrated by irradiating near-infrared femtosecond laser pulses onto the Si materia...

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Autores principales: Xie Hongbo, Zhao Bo, Cheng Jinluo, Chamoli Sandeep Kumar, Zou Tingting, Xin Wei, Yang Jianjun
Formato: article
Lenguaje:EN
Publicado: De Gruyter 2021
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Acceso en línea:https://doaj.org/article/3a6b760c2978449581ea531d252ab85d
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spelling oai:doaj.org-article:3a6b760c2978449581ea531d252ab85d2021-12-05T14:10:56ZSuper-regular femtosecond laser nanolithography based on dual-interface plasmons coupling2192-861410.1515/nanoph-2021-0329https://doaj.org/article/3a6b760c2978449581ea531d252ab85d2021-09-01T00:00:00Zhttps://doi.org/10.1515/nanoph-2021-0329https://doaj.org/toc/2192-8614Advances in femtosecond laser-material interaction facilitate the extension of maskless optical processing to the high efficiency and deep-subwavelength scale. Here, a hybrid plasmon lithography technique has been demonstrated by irradiating near-infrared femtosecond laser pulses onto the Si material coated with thin Cr films in a vacuum chamber, and superior nanograting structures are found to deeply penetrate through the thin Cr film into the underlying Si substrate. In stark contrast to the common ripple structures formed on the Si surface, the Cr-layer mediated Si nanograting structures not only exhibit the spatially super-regular arrangements with a deep-subwavelength period of 355 nm but also present the nonsinusoidal sharp-edged groove geometry with a large depth-to-width aspect ratio of 2.1. Theoretical analyses and calculations reveal that the anomalous structure characterizations are physically ascribed to the excitation of dual-interface coupled plasmons in the thin metal layer, which possess the squeezed spatial wavelength and the periodic columnar intensity distributions. Moreover, the further deepening of periodic nanostructures into the Si substrate is also elucidated by the simulation of electric field enhancements at the bottom of shallow grooves under irradiation of subsequent laser pulses. In combination with a wet etching process, the Si nanograting structures can be modified into the smooth and narrow-mouthed V-profiles, whose optical measurements show a near omnidirectional antireflection especially in the visible range of 565–750 nm, which is expected for the design of advanced photonic devices.Xie HongboZhao BoCheng JinluoChamoli Sandeep KumarZou TingtingXin WeiYang JianjunDe Gruyterarticledeep-subwavelength si nanogratingdual-interface coupled plasmonsfemtosecond laser processingomnidirectional antireflectionsuper-regular lithographyPhysicsQC1-999ENNanophotonics, Vol 10, Iss 15, Pp 3831-3842 (2021)
institution DOAJ
collection DOAJ
language EN
topic deep-subwavelength si nanograting
dual-interface coupled plasmons
femtosecond laser processing
omnidirectional antireflection
super-regular lithography
Physics
QC1-999
spellingShingle deep-subwavelength si nanograting
dual-interface coupled plasmons
femtosecond laser processing
omnidirectional antireflection
super-regular lithography
Physics
QC1-999
Xie Hongbo
Zhao Bo
Cheng Jinluo
Chamoli Sandeep Kumar
Zou Tingting
Xin Wei
Yang Jianjun
Super-regular femtosecond laser nanolithography based on dual-interface plasmons coupling
description Advances in femtosecond laser-material interaction facilitate the extension of maskless optical processing to the high efficiency and deep-subwavelength scale. Here, a hybrid plasmon lithography technique has been demonstrated by irradiating near-infrared femtosecond laser pulses onto the Si material coated with thin Cr films in a vacuum chamber, and superior nanograting structures are found to deeply penetrate through the thin Cr film into the underlying Si substrate. In stark contrast to the common ripple structures formed on the Si surface, the Cr-layer mediated Si nanograting structures not only exhibit the spatially super-regular arrangements with a deep-subwavelength period of 355 nm but also present the nonsinusoidal sharp-edged groove geometry with a large depth-to-width aspect ratio of 2.1. Theoretical analyses and calculations reveal that the anomalous structure characterizations are physically ascribed to the excitation of dual-interface coupled plasmons in the thin metal layer, which possess the squeezed spatial wavelength and the periodic columnar intensity distributions. Moreover, the further deepening of periodic nanostructures into the Si substrate is also elucidated by the simulation of electric field enhancements at the bottom of shallow grooves under irradiation of subsequent laser pulses. In combination with a wet etching process, the Si nanograting structures can be modified into the smooth and narrow-mouthed V-profiles, whose optical measurements show a near omnidirectional antireflection especially in the visible range of 565–750 nm, which is expected for the design of advanced photonic devices.
format article
author Xie Hongbo
Zhao Bo
Cheng Jinluo
Chamoli Sandeep Kumar
Zou Tingting
Xin Wei
Yang Jianjun
author_facet Xie Hongbo
Zhao Bo
Cheng Jinluo
Chamoli Sandeep Kumar
Zou Tingting
Xin Wei
Yang Jianjun
author_sort Xie Hongbo
title Super-regular femtosecond laser nanolithography based on dual-interface plasmons coupling
title_short Super-regular femtosecond laser nanolithography based on dual-interface plasmons coupling
title_full Super-regular femtosecond laser nanolithography based on dual-interface plasmons coupling
title_fullStr Super-regular femtosecond laser nanolithography based on dual-interface plasmons coupling
title_full_unstemmed Super-regular femtosecond laser nanolithography based on dual-interface plasmons coupling
title_sort super-regular femtosecond laser nanolithography based on dual-interface plasmons coupling
publisher De Gruyter
publishDate 2021
url https://doaj.org/article/3a6b760c2978449581ea531d252ab85d
work_keys_str_mv AT xiehongbo superregularfemtosecondlasernanolithographybasedondualinterfaceplasmonscoupling
AT zhaobo superregularfemtosecondlasernanolithographybasedondualinterfaceplasmonscoupling
AT chengjinluo superregularfemtosecondlasernanolithographybasedondualinterfaceplasmonscoupling
AT chamolisandeepkumar superregularfemtosecondlasernanolithographybasedondualinterfaceplasmonscoupling
AT zoutingting superregularfemtosecondlasernanolithographybasedondualinterfaceplasmonscoupling
AT xinwei superregularfemtosecondlasernanolithographybasedondualinterfaceplasmonscoupling
AT yangjianjun superregularfemtosecondlasernanolithographybasedondualinterfaceplasmonscoupling
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