Effects of temperature conditions on fracture toughness of single crystal silicon wafer

This paper provides effects of furnace temperature conditions on the fracture toughness value of cleavage plane {110} on a single crystal silicon wafer. The fracture toughness KIC was measured using the controlled surface flaw (CSF) method under an assumption to develop a thin crack introduced by a...

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Autores principales: Yudai SHIROKI, Kazuki IIDA, Satoshi SUTO, Masayoshi TATENO
Formato: article
Lenguaje:EN
Publicado: The Japan Society of Mechanical Engineers 2019
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Acceso en línea:https://doaj.org/article/3a8dbfd35df649228ebfa1e73d67c99d
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