Jin, F., Chang, T., Lin, C., Liao, J., Ciou, F., Lin, Y., . . . Kuo, T. (2019). Abnormal Positive Bias Temperature Instability Induced by Dipole Doped N-Type MOSCAP. IEEE.
Chicago Style (17th ed.) CitationJin, Fu-Yuan, et al. Abnormal Positive Bias Temperature Instability Induced by Dipole Doped N-Type MOSCAP. IEEE, 2019.
MLA (8th ed.) CitationJin, Fu-Yuan, et al. Abnormal Positive Bias Temperature Instability Induced by Dipole Doped N-Type MOSCAP. IEEE, 2019.
Warning: These citations may not always be 100% accurate.