Jin, F., Chang, T., Lin, C., Liao, J., Ciou, F., Lin, Y., . . . Kuo, T. (2019). Abnormal Positive Bias Temperature Instability Induced by Dipole Doped N-Type MOSCAP. IEEE.
Cita Chicago Style (17a ed.)Jin, Fu-Yuan, et al. Abnormal Positive Bias Temperature Instability Induced by Dipole Doped N-Type MOSCAP. IEEE, 2019.
Cita MLA (8a ed.)Jin, Fu-Yuan, et al. Abnormal Positive Bias Temperature Instability Induced by Dipole Doped N-Type MOSCAP. IEEE, 2019.
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