Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3
Abstract Comprehensive crystal structural study is performed for BiFeO3 (BFO) film grown on KTaO3 (KTO) substrate using transmission electron microscopy (TEM) and x-ray diffraction (XRD). Nano-beam electron diffraction (NBED) combined with structure factor calculation and high resolution TEM images...
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| Autores principales: | , , , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
Nature Portfolio
2018
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/41d0af5ad2d44f9e86b565ed344d5d95 |
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