Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3

Abstract Comprehensive crystal structural study is performed for BiFeO3 (BFO) film grown on KTaO3 (KTO) substrate using transmission electron microscopy (TEM) and x-ray diffraction (XRD). Nano-beam electron diffraction (NBED) combined with structure factor calculation and high resolution TEM images...

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Autores principales:	In-Tae Bae, Tomohiro Ichinose, Myung-Geun Han, Yimei Zhu, Shintaro Yasui, Hiroshi Naganuma
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2018
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/41d0af5ad2d44f9e86b565ed344d5d95
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spelling	oai:doaj.org-article:41d0af5ad2d44f9e86b565ed344d5d952021-12-02T15:09:10ZTensile stress effect on epitaxial BiFeO3 thin film grown on KTaO310.1038/s41598-018-19487-82045-2322https://doaj.org/article/41d0af5ad2d44f9e86b565ed344d5d952018-01-01T00:00:00Zhttps://doi.org/10.1038/s41598-018-19487-8https://doaj.org/toc/2045-2322Abstract Comprehensive crystal structural study is performed for BiFeO3 (BFO) film grown on KTaO3 (KTO) substrate using transmission electron microscopy (TEM) and x-ray diffraction (XRD). Nano-beam electron diffraction (NBED) combined with structure factor calculation and high resolution TEM images clearly reveal that the crystal structure within BFO thin film is rhombohedral BFO, i.e., bulk BFO phase. Epitaxial relationship found by NBED indicates the BFO film grows in a manner that minimizes lattice mismatch with KTO. It further suggests BFO film is under slight biaxial tensile stress (~0.35%) along in-plane direction. XRD reveals BFO lattice is under compressive stress (~1.6%), along out-of-plane direction as a result of the biaxial tensile strain applied along in-plane direction. This leads to Poisson’s ratio of ~0.68. In addition, we demonstrate (1) why hexagonal notation rather than pseudocubic one is required for accurate BFO phase evaluation and (2) a new XRD method that shows how rhombohedral BFO can readily be identified among other phases by measuring a rhombohedral specific Bragg’s reflection.In-Tae BaeTomohiro IchinoseMyung-Geun HanYimei ZhuShintaro YasuiHiroshi NaganumaNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 8, Iss 1, Pp 1-9 (2018)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q In-Tae Bae Tomohiro Ichinose Myung-Geun Han Yimei Zhu Shintaro Yasui Hiroshi Naganuma Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3
description	Abstract Comprehensive crystal structural study is performed for BiFeO3 (BFO) film grown on KTaO3 (KTO) substrate using transmission electron microscopy (TEM) and x-ray diffraction (XRD). Nano-beam electron diffraction (NBED) combined with structure factor calculation and high resolution TEM images clearly reveal that the crystal structure within BFO thin film is rhombohedral BFO, i.e., bulk BFO phase. Epitaxial relationship found by NBED indicates the BFO film grows in a manner that minimizes lattice mismatch with KTO. It further suggests BFO film is under slight biaxial tensile stress (~0.35%) along in-plane direction. XRD reveals BFO lattice is under compressive stress (~1.6%), along out-of-plane direction as a result of the biaxial tensile strain applied along in-plane direction. This leads to Poisson’s ratio of ~0.68. In addition, we demonstrate (1) why hexagonal notation rather than pseudocubic one is required for accurate BFO phase evaluation and (2) a new XRD method that shows how rhombohedral BFO can readily be identified among other phases by measuring a rhombohedral specific Bragg’s reflection.
format	article
author	In-Tae Bae Tomohiro Ichinose Myung-Geun Han Yimei Zhu Shintaro Yasui Hiroshi Naganuma
author_facet	In-Tae Bae Tomohiro Ichinose Myung-Geun Han Yimei Zhu Shintaro Yasui Hiroshi Naganuma
author_sort	In-Tae Bae
title	Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3
title_short	Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3
title_full	Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3
title_fullStr	Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3
title_full_unstemmed	Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3
title_sort	tensile stress effect on epitaxial bifeo3 thin film grown on ktao3
publisher	Nature Portfolio
publishDate	2018
url	https://doaj.org/article/41d0af5ad2d44f9e86b565ed344d5d95
work_keys_str_mv	AT intaebae tensilestresseffectonepitaxialbifeo3thinfilmgrownonktao3 AT tomohiroichinose tensilestresseffectonepitaxialbifeo3thinfilmgrownonktao3 AT myunggeunhan tensilestresseffectonepitaxialbifeo3thinfilmgrownonktao3 AT yimeizhu tensilestresseffectonepitaxialbifeo3thinfilmgrownonktao3 AT shintaroyasui tensilestresseffectonepitaxialbifeo3thinfilmgrownonktao3 AT hiroshinaganuma tensilestresseffectonepitaxialbifeo3thinfilmgrownonktao3
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Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3

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