Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3

Tensile stress effect on epitaxial BiFeO3 thin film grown on KTaO3

Abstract Comprehensive crystal structural study is performed for BiFeO3 (BFO) film grown on KTaO3 (KTO) substrate using transmission electron microscopy (TEM) and x-ray diffraction (XRD). Nano-beam electron diffraction (NBED) combined with structure factor calculation and high resolution TEM images...

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Autores principales: In-Tae Bae, Tomohiro Ichinose, Myung-Geun Han, Yimei Zhu, Shintaro Yasui, Hiroshi Naganuma
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2018
Materias:
Medicine
R
Science
Q
Acceso en línea:https://doaj.org/article/41d0af5ad2d44f9e86b565ed344d5d95
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