One dimensional transport in silicon nanowire junction-less field effect transistors

Abstract Junction-less nanowire transistors are being investigated to solve short channel effects in future CMOS technology. Here we demonstrate 8 nm diameter silicon nanowire junction-less transistors with metallic doping densities which demonstrate clear 1D electronic transport characteristics. Th...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Muhammad M. Mirza, Felix J. Schupp, Jan A. Mol, Donald A. MacLaren, G. Andrew D. Briggs, Douglas J. Paul
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2017
Materias:
R
Q
Acceso en línea:https://doaj.org/article/43a822918176408ba22986aa9ee34ad2
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!