Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition
We report a method of growing a boron-doped diamond film by plasma-assisted chemical vapour deposition utilizing a pre-treatment of GaN substrate to give a high density of nucleation. CVD diamond was deposited on GaN substrate grown epitaxially via the molecular-beam epitaxy process. To obtain a con...
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oai:doaj.org-article:4c24603b3c5746c3bfe75322db523abc2021-11-11T17:53:43ZBoron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition10.3390/ma142163281996-1944https://doaj.org/article/4c24603b3c5746c3bfe75322db523abc2021-10-01T00:00:00Zhttps://www.mdpi.com/1996-1944/14/21/6328https://doaj.org/toc/1996-1944We report a method of growing a boron-doped diamond film by plasma-assisted chemical vapour deposition utilizing a pre-treatment of GaN substrate to give a high density of nucleation. CVD diamond was deposited on GaN substrate grown epitaxially via the molecular-beam epitaxy process. To obtain a continuous diamond film with the presence of well-developed grains, the GaN substrates are exposed to hydrogen plasma prior to deposition. The diamond/GaN heterojunction was deposited in methane ratio, chamber pressure, temperature, and microwave power at 1%, 50 Torr, 500 °C, and 1100 W, respectively. Two samples with different doping were prepared 2000 ppm and 7000 [B/C] in the gas phase. SEM and AFM analyses revealed the presence of well-developed grains with an average size of 100 nm. The epitaxial GaN substrate-induced preferential formation of (111)-facetted diamond was revealed by AFM and XRD. After the deposition process, the signal of the GaN substrate is still visible in Raman spectroscopy (showing three main GaN bands located at 565, 640 and 735 cm<sup>−1</sup>) as well as in typical XRD patterns. Analysis of the current–voltage characteristics as a function of temperature yielded activation energy equal to 93.8 meV.Michał SobaszekMarcin GnybaSławomir KuleszaMirosław BramowiczTomasz KlimczukRobert BogdanowiczMDPI AGarticleepitaxial gallium nitrideboron-doped diamondheterojunctionAFMelectronic propertiesTechnologyTElectrical engineering. Electronics. Nuclear engineeringTK1-9971Engineering (General). Civil engineering (General)TA1-2040MicroscopyQH201-278.5Descriptive and experimental mechanicsQC120-168.85ENMaterials, Vol 14, Iss 6328, p 6328 (2021) |
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collection |
DOAJ |
language |
EN |
topic |
epitaxial gallium nitride boron-doped diamond heterojunction AFM electronic properties Technology T Electrical engineering. Electronics. Nuclear engineering TK1-9971 Engineering (General). Civil engineering (General) TA1-2040 Microscopy QH201-278.5 Descriptive and experimental mechanics QC120-168.85 |
spellingShingle |
epitaxial gallium nitride boron-doped diamond heterojunction AFM electronic properties Technology T Electrical engineering. Electronics. Nuclear engineering TK1-9971 Engineering (General). Civil engineering (General) TA1-2040 Microscopy QH201-278.5 Descriptive and experimental mechanics QC120-168.85 Michał Sobaszek Marcin Gnyba Sławomir Kulesza Mirosław Bramowicz Tomasz Klimczuk Robert Bogdanowicz Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition |
description |
We report a method of growing a boron-doped diamond film by plasma-assisted chemical vapour deposition utilizing a pre-treatment of GaN substrate to give a high density of nucleation. CVD diamond was deposited on GaN substrate grown epitaxially via the molecular-beam epitaxy process. To obtain a continuous diamond film with the presence of well-developed grains, the GaN substrates are exposed to hydrogen plasma prior to deposition. The diamond/GaN heterojunction was deposited in methane ratio, chamber pressure, temperature, and microwave power at 1%, 50 Torr, 500 °C, and 1100 W, respectively. Two samples with different doping were prepared 2000 ppm and 7000 [B/C] in the gas phase. SEM and AFM analyses revealed the presence of well-developed grains with an average size of 100 nm. The epitaxial GaN substrate-induced preferential formation of (111)-facetted diamond was revealed by AFM and XRD. After the deposition process, the signal of the GaN substrate is still visible in Raman spectroscopy (showing three main GaN bands located at 565, 640 and 735 cm<sup>−1</sup>) as well as in typical XRD patterns. Analysis of the current–voltage characteristics as a function of temperature yielded activation energy equal to 93.8 meV. |
format |
article |
author |
Michał Sobaszek Marcin Gnyba Sławomir Kulesza Mirosław Bramowicz Tomasz Klimczuk Robert Bogdanowicz |
author_facet |
Michał Sobaszek Marcin Gnyba Sławomir Kulesza Mirosław Bramowicz Tomasz Klimczuk Robert Bogdanowicz |
author_sort |
Michał Sobaszek |
title |
Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition |
title_short |
Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition |
title_full |
Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition |
title_fullStr |
Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition |
title_full_unstemmed |
Boron-Doped Diamond/GaN Heterojunction—The Influence of the Low-Temperature Deposition |
title_sort |
boron-doped diamond/gan heterojunction—the influence of the low-temperature deposition |
publisher |
MDPI AG |
publishDate |
2021 |
url |
https://doaj.org/article/4c24603b3c5746c3bfe75322db523abc |
work_keys_str_mv |
AT michałsobaszek borondopeddiamondganheterojunctiontheinfluenceofthelowtemperaturedeposition AT marcingnyba borondopeddiamondganheterojunctiontheinfluenceofthelowtemperaturedeposition AT sławomirkulesza borondopeddiamondganheterojunctiontheinfluenceofthelowtemperaturedeposition AT mirosławbramowicz borondopeddiamondganheterojunctiontheinfluenceofthelowtemperaturedeposition AT tomaszklimczuk borondopeddiamondganheterojunctiontheinfluenceofthelowtemperaturedeposition AT robertbogdanowicz borondopeddiamondganheterojunctiontheinfluenceofthelowtemperaturedeposition |
_version_ |
1718431998293311488 |