$Diffraction phase microscopy imaging and multi-physics modeling of the nanoscale thermal expansion of a suspended resistor$
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Diffraction phase microscopy imaging and multi-physics modeling of the nanoscale thermal expansion of a suspended resistor

Abstract We studied the nanoscale thermal expansion of a suspended resistor both theoretically and experimentally and obtained consistent results. In the theoretical analysis, we used a three-dimensional coupled electrical-thermal-mechanical simulation and obtained the temperature and displacement f...

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Autores principales:	Xiaozhen Wang, Tianjian Lu, Xin Yu, Jian-Ming Jin, Lynford L. Goddard
Formato:	article
Lenguaje:	EN
Publicado:	Nature Portfolio 2017
Materias:	Medicine R Science Q
Acceso en línea:	https://doaj.org/article/4fff078a3c524adf96b9f99709003851
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spelling	oai:doaj.org-article:4fff078a3c524adf96b9f997090038512021-12-02T11:40:14ZDiffraction phase microscopy imaging and multi-physics modeling of the nanoscale thermal expansion of a suspended resistor10.1038/s41598-017-04803-52045-2322https://doaj.org/article/4fff078a3c524adf96b9f997090038512017-07-01T00:00:00Zhttps://doi.org/10.1038/s41598-017-04803-5https://doaj.org/toc/2045-2322Abstract We studied the nanoscale thermal expansion of a suspended resistor both theoretically and experimentally and obtained consistent results. In the theoretical analysis, we used a three-dimensional coupled electrical-thermal-mechanical simulation and obtained the temperature and displacement field of the suspended resistor under a direct current (DC) input voltage. In the experiment, we recorded a sequence of images of the axial thermal expansion of the central bridge region of the suspended resistor at a rate of 1.8 frames/s by using epi-illumination diffraction phase microscopy (epi-DPM). This method accurately measured nanometer level relative height changes of the resistor in a temporally and spatially resolved manner. Upon application of a 2 V step in voltage, the resistor exhibited a steady-state increase in resistance of 1.14 Ω and in relative height of 3.5 nm, which agreed reasonably well with the predicted values of 1.08 Ω and 4.4 nm, respectively.Xiaozhen WangTianjian LuXin YuJian-Ming JinLynford L. GoddardNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 7, Iss 1, Pp 1-9 (2017)
institution	DOAJ
collection	DOAJ
language	EN
topic	Medicine R Science Q
spellingShingle	Medicine R Science Q Xiaozhen Wang Tianjian Lu Xin Yu Jian-Ming Jin Lynford L. Goddard Diffraction phase microscopy imaging and multi-physics modeling of the nanoscale thermal expansion of a suspended resistor
description	Abstract We studied the nanoscale thermal expansion of a suspended resistor both theoretically and experimentally and obtained consistent results. In the theoretical analysis, we used a three-dimensional coupled electrical-thermal-mechanical simulation and obtained the temperature and displacement field of the suspended resistor under a direct current (DC) input voltage. In the experiment, we recorded a sequence of images of the axial thermal expansion of the central bridge region of the suspended resistor at a rate of 1.8 frames/s by using epi-illumination diffraction phase microscopy (epi-DPM). This method accurately measured nanometer level relative height changes of the resistor in a temporally and spatially resolved manner. Upon application of a 2 V step in voltage, the resistor exhibited a steady-state increase in resistance of 1.14 Ω and in relative height of 3.5 nm, which agreed reasonably well with the predicted values of 1.08 Ω and 4.4 nm, respectively.
format	article
author	Xiaozhen Wang Tianjian Lu Xin Yu Jian-Ming Jin Lynford L. Goddard
author_facet	Xiaozhen Wang Tianjian Lu Xin Yu Jian-Ming Jin Lynford L. Goddard
author_sort	Xiaozhen Wang
title	Diffraction phase microscopy imaging and multi-physics modeling of the nanoscale thermal expansion of a suspended resistor
title_short	Diffraction phase microscopy imaging and multi-physics modeling of the nanoscale thermal expansion of a suspended resistor
title_full	Diffraction phase microscopy imaging and multi-physics modeling of the nanoscale thermal expansion of a suspended resistor
title_fullStr	Diffraction phase microscopy imaging and multi-physics modeling of the nanoscale thermal expansion of a suspended resistor
title_full_unstemmed	Diffraction phase microscopy imaging and multi-physics modeling of the nanoscale thermal expansion of a suspended resistor
title_sort	diffraction phase microscopy imaging and multi-physics modeling of the nanoscale thermal expansion of a suspended resistor
publisher	Nature Portfolio
publishDate	2017
url	https://doaj.org/article/4fff078a3c524adf96b9f99709003851
work_keys_str_mv	AT xiaozhenwang diffractionphasemicroscopyimagingandmultiphysicsmodelingofthenanoscalethermalexpansionofasuspendedresistor AT tianjianlu diffractionphasemicroscopyimagingandmultiphysicsmodelingofthenanoscalethermalexpansionofasuspendedresistor AT xinyu diffractionphasemicroscopyimagingandmultiphysicsmodelingofthenanoscalethermalexpansionofasuspendedresistor AT jianmingjin diffractionphasemicroscopyimagingandmultiphysicsmodelingofthenanoscalethermalexpansionofasuspendedresistor AT lynfordlgoddard diffractionphasemicroscopyimagingandmultiphysicsmodelingofthenanoscalethermalexpansionofasuspendedresistor
_version_	1718395641363693568

Diffraction phase microscopy imaging and multi-physics modeling of the nanoscale thermal expansion of a suspended resistor

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