Enhanced ferroelectric switching speed of Si-doped HfO2 thin film tailored by oxygen deficiency

Abstract Investigations concerning oxygen deficiency will increase our understanding of those factors that govern the overall material properties. Various studies have examined the relationship between oxygen deficiency and the phase transformation from a nonpolar phase to a polar phase in HfO2 thin...

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Autores principales: Kyoungjun Lee, Kunwoo Park, Hyun-Jae Lee, Myeong Seop Song, Kyu Cheol Lee, Jin Namkung, Jun Hee Lee, Jungwon Park, Seung Chul Chae
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Publicado: Nature Portfolio 2021
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Acceso en línea:https://doaj.org/article/54100e1171b5496c96e61a4182e053c2
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spelling oai:doaj.org-article:54100e1171b5496c96e61a4182e053c22021-12-02T17:05:12ZEnhanced ferroelectric switching speed of Si-doped HfO2 thin film tailored by oxygen deficiency10.1038/s41598-021-85773-72045-2322https://doaj.org/article/54100e1171b5496c96e61a4182e053c22021-03-01T00:00:00Zhttps://doi.org/10.1038/s41598-021-85773-7https://doaj.org/toc/2045-2322Abstract Investigations concerning oxygen deficiency will increase our understanding of those factors that govern the overall material properties. Various studies have examined the relationship between oxygen deficiency and the phase transformation from a nonpolar phase to a polar phase in HfO2 thin films. However, there are few reports on the effects of oxygen deficiencies on the switching dynamics of the ferroelectric phase itself. Herein, we report the oxygen- deficiency induced enhancement of ferroelectric switching properties of Si-doped HfO2 thin films. By controlling the annealing conditions, we controlled the oxygen deficiency concentration in the ferroelectric orthorhombic HfO2 phase. Rapid high-temperature (800 °C) annealing of the HfO2 film accelerated the characteristic switching speed compared to low-temperature (600 °C) annealing. Scanning transmission electron microscopy and electron energy-loss spectroscopy (EELS) revealed that thermal annealing increased oxygen deficiencies, and first-principles calculations demonstrated a reduction of the energy barrier of the polarization flip with increased oxygen deficiency. A Monte Carlo simulation for the variation in the energy barrier of the polarization flipping confirmed the increase of characteristic switching speed.Kyoungjun LeeKunwoo ParkHyun-Jae LeeMyeong Seop SongKyu Cheol LeeJin NamkungJun Hee LeeJungwon ParkSeung Chul ChaeNature PortfolioarticleMedicineRScienceQENScientific Reports, Vol 11, Iss 1, Pp 1-9 (2021)
institution DOAJ
collection DOAJ
language EN
topic Medicine
R
Science
Q
spellingShingle Medicine
R
Science
Q
Kyoungjun Lee
Kunwoo Park
Hyun-Jae Lee
Myeong Seop Song
Kyu Cheol Lee
Jin Namkung
Jun Hee Lee
Jungwon Park
Seung Chul Chae
Enhanced ferroelectric switching speed of Si-doped HfO2 thin film tailored by oxygen deficiency
description Abstract Investigations concerning oxygen deficiency will increase our understanding of those factors that govern the overall material properties. Various studies have examined the relationship between oxygen deficiency and the phase transformation from a nonpolar phase to a polar phase in HfO2 thin films. However, there are few reports on the effects of oxygen deficiencies on the switching dynamics of the ferroelectric phase itself. Herein, we report the oxygen- deficiency induced enhancement of ferroelectric switching properties of Si-doped HfO2 thin films. By controlling the annealing conditions, we controlled the oxygen deficiency concentration in the ferroelectric orthorhombic HfO2 phase. Rapid high-temperature (800 °C) annealing of the HfO2 film accelerated the characteristic switching speed compared to low-temperature (600 °C) annealing. Scanning transmission electron microscopy and electron energy-loss spectroscopy (EELS) revealed that thermal annealing increased oxygen deficiencies, and first-principles calculations demonstrated a reduction of the energy barrier of the polarization flip with increased oxygen deficiency. A Monte Carlo simulation for the variation in the energy barrier of the polarization flipping confirmed the increase of characteristic switching speed.
format article
author Kyoungjun Lee
Kunwoo Park
Hyun-Jae Lee
Myeong Seop Song
Kyu Cheol Lee
Jin Namkung
Jun Hee Lee
Jungwon Park
Seung Chul Chae
author_facet Kyoungjun Lee
Kunwoo Park
Hyun-Jae Lee
Myeong Seop Song
Kyu Cheol Lee
Jin Namkung
Jun Hee Lee
Jungwon Park
Seung Chul Chae
author_sort Kyoungjun Lee
title Enhanced ferroelectric switching speed of Si-doped HfO2 thin film tailored by oxygen deficiency
title_short Enhanced ferroelectric switching speed of Si-doped HfO2 thin film tailored by oxygen deficiency
title_full Enhanced ferroelectric switching speed of Si-doped HfO2 thin film tailored by oxygen deficiency
title_fullStr Enhanced ferroelectric switching speed of Si-doped HfO2 thin film tailored by oxygen deficiency
title_full_unstemmed Enhanced ferroelectric switching speed of Si-doped HfO2 thin film tailored by oxygen deficiency
title_sort enhanced ferroelectric switching speed of si-doped hfo2 thin film tailored by oxygen deficiency
publisher Nature Portfolio
publishDate 2021
url https://doaj.org/article/54100e1171b5496c96e61a4182e053c2
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