Atomic-scale disproportionation in amorphous silicon monoxide
Amorphous silicon monoxide is known to undergo disproportionation to silicon- and silicon dioxide-like regions, however direct observation of the atomic-scale heterogeneity is still missing. Here, the authors use angstrom-beam electron diffraction to reveal precise structural details of this unusual...
Guardado en:
Autores principales: | , , , , , , , , |
---|---|
Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2016
|
Materias: | |
Acceso en línea: | https://doaj.org/article/57e460c287024c48a16460fe1ab93716 |
Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|