Atomic-scale disproportionation in amorphous silicon monoxide

Amorphous silicon monoxide is known to undergo disproportionation to silicon- and silicon dioxide-like regions, however direct observation of the atomic-scale heterogeneity is still missing. Here, the authors use angstrom-beam electron diffraction to reveal precise structural details of this unusual...

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Auteurs principaux: Akihiko Hirata, Shinji Kohara, Toshihiro Asada, Masazumi Arao, Chihiro Yogi, Hideto Imai, Yongwen Tan, Takeshi Fujita, Mingwei Chen
Format: article
Langue:EN
Publié: Nature Portfolio 2016
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Accès en ligne:https://doaj.org/article/57e460c287024c48a16460fe1ab93716
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