Atomic-scale disproportionation in amorphous silicon monoxide
Amorphous silicon monoxide is known to undergo disproportionation to silicon- and silicon dioxide-like regions, however direct observation of the atomic-scale heterogeneity is still missing. Here, the authors use angstrom-beam electron diffraction to reveal precise structural details of this unusual...
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Autores principales: | Akihiko Hirata, Shinji Kohara, Toshihiro Asada, Masazumi Arao, Chihiro Yogi, Hideto Imai, Yongwen Tan, Takeshi Fujita, Mingwei Chen |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2016
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Materias: | |
Acceso en línea: | https://doaj.org/article/57e460c287024c48a16460fe1ab93716 |
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