A study of dopant incorporation in Te-doped GaAsSb nanowires using a combination of XPS/UPS, and C-AFM/SKPM
Abstract We report the first study on doping assessment in Te-doped GaAsSb nanowires (NWs) with variation in Gallium Telluride (GaTe) cell temperature, using X-ray photoelectron spectroscopy (XPS), ultraviolet photoelectron spectroscopy (UPS), conductive-atomic force microscopy (C-AFM), and scanning...
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Main Authors: | , , , , , , , |
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Format: | article |
Language: | EN |
Published: |
Nature Portfolio
2021
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Subjects: | |
Online Access: | https://doaj.org/article/588911d201ed4ed5bbdbf5b16547683e |
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