Exact statistical solution for the hopping transport of trapped charge via finite Markov jump processes

Abstract In this study, we developed a discrete theory of the charge transport in thin dielectric films by trapped electrons or holes, that is applicable both for the case of countable and a large number of traps. It was shown that Shockley–Read–Hall-like transport equations, which describe the 1D t...

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Autores principales: Andrey A. Pil’nik, Andrey A. Chernov, Damir R. Islamov
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2021
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Acceso en línea:https://doaj.org/article/5fd90716bfe94b3aaa11b192464cdac2
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