KSEMAW: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements [version 1; peer review: 2 approved]
The optical behavior of devices based on thin films is determined by complex refractive index and thickness of each slab composing the stack; these important parameters are usually evaluated from photometric and/or ellipsometric spectral measurements, given a model of the stack, by means of dedicate...
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| Autores principales: | , , , |
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| Formato: | article |
| Lenguaje: | EN |
| Publicado: |
F1000 Research Limited
2021
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| Materias: | |
| Acceso en línea: | https://doaj.org/article/61e7caa0e6da4ecab3178820bd2b6cc4 |
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