KSEMAW: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements [version 1; peer review: 2 approved]

The optical behavior of devices based on thin films is determined by complex refractive index and thickness of each slab composing the stack; these important parameters are usually evaluated from photometric and/or ellipsometric spectral measurements, given a model of the stack, by means of dedicate...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autores principales: Marco Montecchi, Alberto Mittiga, Claudia Malerba, Francesca Menchini
Formato: article
Lenguaje:EN
Publicado: F1000 Research Limited 2021
Materias:
Q
H
Acceso en línea:https://doaj.org/article/61e7caa0e6da4ecab3178820bd2b6cc4
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!