KSEMAW: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements [version 1; peer review: 2 approved]

The optical behavior of devices based on thin films is determined by complex refractive index and thickness of each slab composing the stack; these important parameters are usually evaluated from photometric and/or ellipsometric spectral measurements, given a model of the stack, by means of dedicate...

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Autores principales:	Marco Montecchi, Alberto Mittiga, Claudia Malerba, Francesca Menchini
Formato:	article
Lenguaje:	EN
Publicado:	F1000 Research Limited 2021
Materias:	Science Q Social Sciences H
Acceso en línea:	https://doaj.org/article/61e7caa0e6da4ecab3178820bd2b6cc4
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id	oai:doaj.org-article:61e7caa0e6da4ecab3178820bd2b6cc4
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spelling	oai:doaj.org-article:61e7caa0e6da4ecab3178820bd2b6cc42021-11-08T10:54:00ZKSEMAW: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements [version 1; peer review: 2 approved]2732-512110.12688/openreseurope.13842.1https://doaj.org/article/61e7caa0e6da4ecab3178820bd2b6cc42021-08-01T00:00:00Zhttps://open-research-europe.ec.europa.eu/articles/1-95/v1https://doaj.org/toc/2732-5121The optical behavior of devices based on thin films is determined by complex refractive index and thickness of each slab composing the stack; these important parameters are usually evaluated from photometric and/or ellipsometric spectral measurements, given a model of the stack, by means of dedicated software. In the case of complex multilayer devices, generally a number of simpler specimens (like single-film on substrate) must be preliminarily characterized. This paper introduces the reader to a new open source software for thin film characterization finally released after about 30 years of development. The software has already been used in various fields of physics, such as thin film optical filters, architectural glazing, detectors for high energy physics, solar energy, and, last but not least, photovoltaic devices. Code source files, user manual as well as a sample of working directories populated with assorted files can be freely downloaded from the kSEMAW GitHub repository.Marco MontecchiAlberto MittigaClaudia MalerbaFrancesca MenchiniF1000 Research LimitedarticleScienceQSocial SciencesHENOpen Research Europe, Vol 1 (2021)
institution	DOAJ
collection	DOAJ
language	EN
topic	Science Q Social Sciences H
spellingShingle	Science Q Social Sciences H Marco Montecchi Alberto Mittiga Claudia Malerba Francesca Menchini KSEMAW: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements [version 1; peer review: 2 approved]
description	The optical behavior of devices based on thin films is determined by complex refractive index and thickness of each slab composing the stack; these important parameters are usually evaluated from photometric and/or ellipsometric spectral measurements, given a model of the stack, by means of dedicated software. In the case of complex multilayer devices, generally a number of simpler specimens (like single-film on substrate) must be preliminarily characterized. This paper introduces the reader to a new open source software for thin film characterization finally released after about 30 years of development. The software has already been used in various fields of physics, such as thin film optical filters, architectural glazing, detectors for high energy physics, solar energy, and, last but not least, photovoltaic devices. Code source files, user manual as well as a sample of working directories populated with assorted files can be freely downloaded from the kSEMAW GitHub repository.
format	article
author	Marco Montecchi Alberto Mittiga Claudia Malerba Francesca Menchini
author_facet	Marco Montecchi Alberto Mittiga Claudia Malerba Francesca Menchini
author_sort	Marco Montecchi
title	KSEMAW: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements [version 1; peer review: 2 approved]
title_short	KSEMAW: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements [version 1; peer review: 2 approved]
title_full	KSEMAW: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements [version 1; peer review: 2 approved]
title_fullStr	KSEMAW: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements [version 1; peer review: 2 approved]
title_full_unstemmed	KSEMAW: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements [version 1; peer review: 2 approved]
title_sort	ksemaw: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements [version 1; peer review: 2 approved]
publisher	F1000 Research Limited
publishDate	2021
url	https://doaj.org/article/61e7caa0e6da4ecab3178820bd2b6cc4
work_keys_str_mv	AT marcomontecchi ksemawanopensourcesoftwarefortheanalysisofspectrophotometricellipsometricandphotothermaldeflectionspectroscopymeasurementsversion1peerreview2approved AT albertomittiga ksemawanopensourcesoftwarefortheanalysisofspectrophotometricellipsometricandphotothermaldeflectionspectroscopymeasurementsversion1peerreview2approved AT claudiamalerba ksemawanopensourcesoftwarefortheanalysisofspectrophotometricellipsometricandphotothermaldeflectionspectroscopymeasurementsversion1peerreview2approved AT francescamenchini ksemawanopensourcesoftwarefortheanalysisofspectrophotometricellipsometricandphotothermaldeflectionspectroscopymeasurementsversion1peerreview2approved
_version_	1718442528531808256

KSEMAW: an open source software for the analysis ofspectrophotometric, ellipsometric andphotothermal deflection spectroscopy measurements [version 1; peer review: 2 approved]

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