Hybrid artificial neural networks and analytical model for prediction of optical constants and bandgap energy of 3D nanonetwork silicon structures

The aim of this study is to develop a reliable method to determine optical constants for 3D-nanonetwork Si thin films manufactured using a pulsed-laser ablation technique that can be applied to other materials synthesized by this technique. An analytical method was introduced to calculate optical co...

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Autores principales: Shreeniket Joshi, Amirkianoosh Kiani
Formato: article
Lenguaje:EN
Publicado: Institue of Optics and Electronics, Chinese Academy of Sciences 2021
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Acceso en línea:https://doaj.org/article/6245394f395241d0a9cab1f2f2fb20c4
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