Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose

With conventional scanning transmission electron microscopy, some sensitive materials are difficult to image with atomic resolution. The authors present a method of mixed-state electron ptychography that enables picometer precision with fast acquisition and low dosage.

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Autores principales: Zhen Chen, Michal Odstrcil, Yi Jiang, Yimo Han, Ming-Hui Chiu, Lain-Jong Li, David A. Muller
Formato: article
Lenguaje:EN
Publicado: Nature Portfolio 2020
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Acceso en línea:https://doaj.org/article/6335039a21c2477fb747de0d415bf2ba
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