Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management
This article reports design, fabrication and analysis of a novel under-transistor (under-FET) in-hole thermal sensor diode structure. Being able to accurately monitor self-heating of individual transistor in-operando, the under-FET temperature sensor enables smart full-chip run-time thermal manageme...
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| Main Authors: | , , , , , , |
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| Format: | article |
| Language: | EN |
| Published: |
IEEE
2020
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| Subjects: | |
| Online Access: | https://doaj.org/article/63ecbbc27e664ef08261d3efa734b889 |
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