Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management

This article reports design, fabrication and analysis of a novel under-transistor (under-FET) in-hole thermal sensor diode structure. Being able to accurately monitor self-heating of individual transistor in-operando, the under-FET temperature sensor enables smart full-chip run-time thermal manageme...

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Auteurs principaux: Cheng Li, Qi Chen, Feilong Zhang, Mengfu Di, Zijin Pan, Fei Lu, Albert Wang
Format: article
Langue:EN
Publié: IEEE 2020
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Accès en ligne:https://doaj.org/article/63ecbbc27e664ef08261d3efa734b889
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