Influence of thermal diffuse scattering on image contrast in scanning transmission electron microscopy
We analyze the loss of contrast in simulated atomic-resolution annular dark-field scan- ning transmission electron microscopy images due to the incoherent thermal diffuse scattering (TDS) for SrTiO3 and PbTiO3 samples. The contribution of TDS in the contrast reduction is evaluated within the TDS...
Guardado en:
Autor principal: | |
---|---|
Formato: | article |
Lenguaje: | EN |
Publicado: |
D.Ghitu Institute of Electronic Engineering and Nanotechnologies
2007
|
Materias: | |
Acceso en línea: | https://doaj.org/article/65f2b2bb933c4b42ac52885fe9c4ad8b |
Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|