Influence of thermal diffuse scattering on image contrast in scanning transmission electron microscopy

We analyze the loss of contrast in simulated atomic-resolution annular dark-field scan- ning transmission electron microscopy images due to the incoherent thermal diffuse scattering (TDS) for SrTiO3 and PbTiO3 samples. The contribution of TDS in the contrast reduction is evaluated within the TDS...

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Autor principal:	Croitoru, Marin
Formato:	article
Lenguaje:	EN
Publicado:	D.Ghitu Institute of Electronic Engineering and Nanotechnologies 2007
Materias:	Physics QC1-999 Electronics TK7800-8360
Acceso en línea:	https://doaj.org/article/65f2b2bb933c4b42ac52885fe9c4ad8b
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spelling	oai:doaj.org-article:65f2b2bb933c4b42ac52885fe9c4ad8b2021-11-21T12:08:31ZInfluence of thermal diffuse scattering on image contrast in scanning transmission electron microscopy 2537-63651810-648Xhttps://doaj.org/article/65f2b2bb933c4b42ac52885fe9c4ad8b2007-01-01T00:00:00Zhttps://mjps.nanotech.md/archive/2007/article/3683https://doaj.org/toc/1810-648Xhttps://doaj.org/toc/2537-6365We analyze the loss of contrast in simulated atomic-resolution annular dark-field scan- ning transmission electron microscopy images due to the incoherent thermal diffuse scattering (TDS) for SrTiO3 and PbTiO3 samples. The contribution of TDS in the contrast reduction is evaluated within the TDS generation function approximation. From the thickness dependence of the contrast loss in simulated images it is seen that inclusion of thermal diffuse scattering leads to a strong reduction of the image contrast. PACS numbers: 61.16.Bg; 87.64.Bx Croitoru, MarinD.Ghitu Institute of Electronic Engineering and NanotechnologiesarticlePhysicsQC1-999ElectronicsTK7800-8360ENMoldavian Journal of the Physical Sciences, Vol 6, Iss 1, Pp 48-57 (2007)
institution	DOAJ
collection	DOAJ
language	EN
topic	Physics QC1-999 Electronics TK7800-8360
spellingShingle	Physics QC1-999 Electronics TK7800-8360 Croitoru, Marin Influence of thermal diffuse scattering on image contrast in scanning transmission electron microscopy
description	We analyze the loss of contrast in simulated atomic-resolution annular dark-field scan- ning transmission electron microscopy images due to the incoherent thermal diffuse scattering (TDS) for SrTiO3 and PbTiO3 samples. The contribution of TDS in the contrast reduction is evaluated within the TDS generation function approximation. From the thickness dependence of the contrast loss in simulated images it is seen that inclusion of thermal diffuse scattering leads to a strong reduction of the image contrast. PACS numbers: 61.16.Bg; 87.64.Bx
format	article
author	Croitoru, Marin
author_facet	Croitoru, Marin
author_sort	Croitoru, Marin
title	Influence of thermal diffuse scattering on image contrast in scanning transmission electron microscopy
title_short	Influence of thermal diffuse scattering on image contrast in scanning transmission electron microscopy
title_full	Influence of thermal diffuse scattering on image contrast in scanning transmission electron microscopy
title_fullStr	Influence of thermal diffuse scattering on image contrast in scanning transmission electron microscopy
title_full_unstemmed	Influence of thermal diffuse scattering on image contrast in scanning transmission electron microscopy
title_sort	influence of thermal diffuse scattering on image contrast in scanning transmission electron microscopy
publisher	D.Ghitu Institute of Electronic Engineering and Nanotechnologies
publishDate	2007
url	https://doaj.org/article/65f2b2bb933c4b42ac52885fe9c4ad8b
work_keys_str_mv	AT croitorumarin influenceofthermaldiffusescatteringonimagecontrastinscanningtransmissionelectronmicroscopy
_version_	1718419190791012352

Influence of thermal diffuse scattering on image contrast in scanning transmission electron microscopy

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