Misorientation-angle-dependent electrical transport across molybdenum disulfide grain boundaries
Grain boundaries can degrade the performance of electronic devices made from single atomic layers of transition metal dichalcogenides. Here, the authors combine transport measurements and transmission electron microscopy to find a correlation between field-effect mobility and grain misorientation an...
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Main Authors: | Thuc Hue Ly, David J. Perello, Jiong Zhao, Qingming Deng, Hyun Kim, Gang Hee Han, Sang Hoon Chae, Hye Yun Jeong, Young Hee Lee |
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Format: | article |
Language: | EN |
Published: |
Nature Portfolio
2016
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Online Access: | https://doaj.org/article/689dd66d07eb425aa63b1656d2d5c61d |
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