Substrate-Driven Atomic Layer Deposition of High-κ Dielectrics on 2D Materials

Atomic layer deposition (ALD) of high-κ dielectrics on two-dimensional (2D) materials (including graphene and transition metal dichalcogenides) still represents a challenge due to the lack of out-of-plane bonds on the pristine surfaces of 2D materials, thus making the nucleation process highly disad...

Full description

Saved in:
Bibliographic Details
Main Authors: Emanuela Schilirò, Raffaella Lo Nigro, Fabrizio Roccaforte, Filippo Giannazzo
Format: article
Language:EN
Published: MDPI AG 2021
Subjects:
ALD
T
Online Access:https://doaj.org/article/69690cf09bd44f228ad8bb72277bc293
Tags: Add Tag
No Tags, Be the first to tag this record!