Strain effects on polycrystalline germanium thin films
Abstract Polycrystalline Ge thin films have attracted increasing attention because their hole mobilities exceed those of single-crystal Si wafers, while the process temperature is low. In this study, we investigate the strain effects on the crystal and electrical properties of polycrystalline Ge lay...
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Autores principales: | Toshifumi Imajo, Takashi Suemasu, Kaoru Toko |
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Formato: | article |
Lenguaje: | EN |
Publicado: |
Nature Portfolio
2021
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Materias: | |
Acceso en línea: | https://doaj.org/article/6be6c68941b4463b80afec4cd4a2e62f |
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